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    <responseDate>2026-10-14T03:09:43Z</responseDate>
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    <identifier>10.57760/sciencedb.010c2</identifier>
    <datestamp>2026-08-26T13:45:49Z</datestamp>
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<oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:date>2026-08-26</dc:date>
  <dc:title>Dataset for the Article &amp;ldquo;Non-Contact Single Event Effect Detection Method Based on Noise2Self-KNN&amp;rdquo;</dc:title>
  <dc:identifier>doi:10.57760/sciencedb.010c2</dc:identifier>
  <dc:language>en</dc:language>
  <dc:description>This dataset is intended to support research on the non-contact detection of single-event effects (SEEs) in field-programmable gate arrays (FPGAs) based on electromagnetic radiation signals. A Xilinx Kintex-7 XC7K325TFFG900 FPGA was used as the device under test. A near-field electromagnetic probe and a HackRF One software-defined radio platform were employed to acquire the electromagnetic radiation signals generated by the FPGA during normal operation and under different types of single-event effects.A picosecond pulsed laser was used to simulate the irradiation of the FPGA by high-energy particles in space. By controlling a three-dimensional positioning stage, the laser was focused on different sensitive regions of the FPGA to trigger single-event upsets (SEUs) and micro single-event latch-ups (&amp;mu;-SELs). Throughout the experiment, the FPGA continuously executed a DDR read-write program to approximate the conditions under which a device operating in a practical application is affected by single-event effects.The local oscillator frequency of the HackRF One was set to the clock frequency of the FPGA. The acquired signals were processed through mixing, low-pass filtering, and analog-to-digital conversion to obtain the in-phase (I) and quadrature (Q) components. A Python program was subsequently used for signal demodulation and amplitude calculation, producing electromagnetic radiation signals that characterize the operating states of the FPGA.The dataset contains the following three operating conditions:Normal FPGA operation;FPGA operation affected by a single-event upset (SEU);FPGA operation affected by a micro single-event latch-up (&amp;mu;-SEL).In addition, we provide a dataset acquired while the FPGA continuously executed an Advanced Encryption Standard (AES) program. This supplementary dataset can be used to evaluate the generalization capability of single-event-effect</dc:description>
  <dc:subject>Single event latch-up ; Single event effect;  machine learning</dc:subject>
  <dc:creator>Yifan Du</dc:creator>
  <dc:rights>PUBLIC</dc:rights>
  <dc:rights>https://creativecommons.org/licenses/by-nc-sa/4.0/</dc:rights>
  <dc:type>dataset</dc:type>
  <dc:publisher>Science Data Bank</dc:publisher>
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