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    <responseDate>2026-10-06T15:50:40Z</responseDate>
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    <identifier>10.57760/sciencedb.013v4</identifier>
    <datestamp>2026-09-28T16:06:53Z</datestamp>
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  <dc:date>2026-09-28</dc:date>
  <dc:title>Failure Analysis Data of Gold-Aluminum Bonding for Aerospace ASIC LMD2021</dc:title>
  <dc:identifier>doi:10.57760/sciencedb.013v4</dc:identifier>
  <dc:language>en</dc:language>
  <dc:description>The ASIC金铝键合失效分析数据 dataset is a complete data package for the failure analysis of gold-aluminum wire bonding during the quality assurance test of the LMD2021A modulator-driver ASIC (CQFN32 package, SiGe BiCMOS process), covering the period from April to August 2026. It contains 10 documents and 2 SEM microscopy subdirectories (5 microscopy samples in total), organized around a complete evidence chain of &amp;ldquo;QA-test failure &amp;rarr; DT trouble-shooting &amp;rarr; thermal design &amp;amp; temperature reconstruction &amp;rarr; process re-verification &amp;amp; comparison &amp;rarr; micro-mechanism&amp;rdquo;. Specifically, the V1.1 Technical Analysis Report (6.6 MB) serves as the master report, covering the four-stage test flow on 41 samples, the failure phenomena of units #35/#26, the failure analysis from Guangzhou 5th Institute, the fault-tree analysis, the Arrhenius life-prediction model, and the optimization proposals for Schemes A/B; the 300&amp;deg;C/24h pull-strength data and the verification-unit bond-strength data provide direct evidence for process re-verification, while the burn-in/test re-inspection results and the data from low-power reference chips (LSD2021C, TRNG2016, etc.) are used to rule out correlations with power dissipation and process; the thermal simulation report (Rjc-bottom = 22.90&amp;deg;C/W) and the thermal-resistance test report V2 (Rj-top = 56.43&amp;deg;C/W) are used for temperature reconstruction, and the FX0426 third-party quality certificate together with the V2040 production-flow records provide batch-quality and traceability support; the SEM images of the F-12 failed samples and the 300&amp;deg;C verification samples furnish first-hand micro-evidence of IMC morphology, Kirkendall voids, and bond-pad cracking.</dc:description>
  <dc:subject>gold-aluminum bonding; Aerospace ASIC; failure analysis</dc:subject>
  <dc:creator>Li Ruixuan</dc:creator>
  <dc:rights>PUBLIC</dc:rights>
  <dc:rights>https://creativecommons.org/licenses/by-nc-nd/4.0/</dc:rights>
  <dc:type>dataset</dc:type>
  <dc:publisher>Science Data Bank</dc:publisher>
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