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    <responseDate>2026-10-13T22:24:19Z</responseDate>
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    <identifier>10.57760/sciencedb.05895</identifier>
    <datestamp>2022-11-27T23:06:05Z</datestamp>
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<oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:date>2022-11-27</dc:date>
  <dc:title>Soybean crack dataset</dc:title>
  <dc:identifier>doi:10.57760/sciencedb.05895</dc:identifier>
  <dc:language>en</dc:language>
  <dc:description>Two hundred soybean seeds (Wan Dou 15, Anhui Lvyu Seed Industry Co., Ltd, Benbu, China) were used in this study. One group (n =100) was classified as the normal seeds, whereas the second group (n =75) was composed of artificially cracked seeds, and the three group (n =25) was made up of nature cracked seeds. Normal and nature cracked seeds were screened out from purchased soybean seeds. Artificial cracks were developed by soaking and oven drying normal soybean seeds</dc:description>
  <dc:subject>soybean seeds; crack; near infrared sepctroscopy</dc:subject>
  <dc:creator>Liusan Wang</dc:creator>
  <dc:rights>PUBLIC</dc:rights>
  <dc:rights>https://creativecommons.org/licenses/by-nc-nd/4.0/</dc:rights>
  <dc:type>dataset</dc:type>
  <dc:publisher>Science Data Bank</dc:publisher>
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