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    <responseDate>2026-10-14T03:11:26Z</responseDate>
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    <identifier>10.57760/sciencedb.09619</identifier>
    <datestamp>2024-06-26T16:10:43Z</datestamp>
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  <dc:date>2024-06-26</dc:date>
  <dc:title>Measuring the Absorption of Optical Thin Films Using Single Lens Surface Thermal Lens Technique</dc:title>
  <dc:identifier>doi:10.57760/sciencedb.09619</dc:identifier>
  <dc:language>en</dc:language>
  <dc:description>A hydrofluoric acid monolayer film with a thickness of approximately 700nm was deposited on a fused quartz substrate using electron beam evaporation. Six samples were selected and their absorption was measured using a spectroscopic device and a single lens device. In order to eliminate absorption differences in different regions of the sample, 12 points were selected for measurement and the average value was calculated, which is about 10%, proving the effectiveness of this method.&amp;nbsp;The absorption data of the sample measured by the spectroscopic device are 46.35ppm, 44.45ppm, 44.65ppm, 45.50ppm, 46.5ppm, 46.75ppm.&amp;nbsp;The absorption data of the sample measured by a single lens device are 42.15ppm, 40.9ppm, 41.25ppm, 39.25ppm, 41.7ppm, 42.6ppm.&amp;nbsp;</dc:description>
  <dc:subject>surface thermal lens; absorption loss; optical thin films; photothermal deformation</dc:subject>
  <dc:creator>Hua Yan</dc:creator>
  <dc:creator>Li Dawei</dc:creator>
  <dc:creator>Han Yujing</dc:creator>
  <dc:creator>Liu Xiaofeng</dc:creator>
  <dc:creator>Zhao Yuan'an</dc:creator>
  <dc:rights>PUBLIC</dc:rights>
  <dc:rights>https://creativecommons.org/licenses/by/4.0/</dc:rights>
  <dc:type>dataset</dc:type>
  <dc:publisher>Science Data Bank</dc:publisher>
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