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    <identifier>10.57760/sciencedb.13258</identifier>
    <datestamp>2024-01-15T00:33:14Z</datestamp>
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<oai_dc:dc xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:date>2024-01-15</dc:date>
  <dc:title>Design and simulation in plasmonic interference lithography based on the second-order diffracted wave of grating and hyperbolic multilayer graphene</dc:title>
  <dc:identifier>doi:10.57760/sciencedb.13258</dc:identifier>
  <dc:language>en</dc:language>
  <dc:description>A plasmonic interference lithography based on the second-order diffracted wave of grating&amp;nbsp;and hyperbolic multilayer graphene is proposed. Simulation results show that structures with air gaps can obtain interference patterns with a half-pitch resolution&amp;nbsp;of 1/8&amp;nbsp;of the grating&amp;nbsp;period.（Revision: The cover is the Schematic of SPP interference structure ）The contents of documents:Fig. 1. Schematic of SPP interference structure.Fig. 2. Electric field intensity distribution in the lithography structure.Fig. 3.&amp;nbsp;The normalized Eelectric field intensities&amp;nbsp;at 3 positions in the PR layer, and contrast between the two lithography structures.Fig. 4.&amp;nbsp;Test of grating groove width.(without bottom SiO2)Fig. 5.&amp;nbsp;Test of grating groove width.(with bottom SiO2)Fig. 6. Test of SiO2&amp;nbsp;thickness.Fig. 7. Test of air gap thicknesses.efield2.txt is the simulation result data of electric field intensity distribution in the lithography structure.(unit: V/m, row label as y-direction coordinate (unit: nm), column label as z-direction coordinate (unit: nm))</dc:description>
  <dc:subject>period reduction lithography; surface plasmon polaritons; interference lithography; multilayer graphene</dc:subject>
  <dc:creator>Yu Long</dc:creator>
  <dc:creator>Hui Zhong</dc:creator>
  <dc:creator>Ye Tian</dc:creator>
  <dc:rights>RESTRICTED</dc:rights>
  <dc:type>dataset</dc:type>
  <dc:relation>http://www.doi.org/10.1364/optcon.513843</dc:relation>
  <dc:publisher>Science Data Bank</dc:publisher>
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