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    <identifier>10.57760/sciencedb.26918</identifier>
    <datestamp>2025-06-24T09:18:53Z</datestamp>
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  <dc:date>2025-06-24</dc:date>
  <dc:title>A dataset of ferroelectricity-tuned Upconversion Luminescence in Yb3+/Er3+-Doped Bi4Ti3O12 Thin Films for Information Photonics Applications</dc:title>
  <dc:identifier>doi:10.57760/sciencedb.26918</dc:identifier>
  <dc:language>en</dc:language>
  <dc:description>Structural CharacterizationXRD raw data&amp;nbsp;(Fig. 1B-C): 2&amp;theta;-intensity values for Bi₃.₉₋ₓYbₓEr₀.₁Ti₃O₁₂ films (x = 0.1&amp;ndash;1.0)EDS quantitative results&amp;nbsp;(Fig. 1D): Atomic percentages of Bi/Ti/Yb/ErSEM/TEM images&amp;nbsp;(Fig. 1E-F): High-resolution originals of surface/cross-section morphology (TIFF/PNG format)Functional Property MeasurementsFerroelectric hysteresis loops&amp;nbsp;(Fig. 2C, 3A-B):&amp;nbsp;P-E&amp;nbsp;curves (electric field vs. polarization) and&amp;nbsp;*I-E*&amp;nbsp;current curvesUpconversion luminescence (UCL) spectra&amp;nbsp;(Fig. 2A, 4B): Wavelength-intensity data under 980 nm excitation (0&amp;ndash;30 V)Real-time UCL modulation&amp;nbsp;(Fig. 4C): Time-resolved intensity at 545 nm under square-wave voltagesDevice Performance DataSignal encoding datasets&amp;nbsp;(Fig. 5):Voltage input sequences for &amp;quot;UCAS&amp;quot; ASCII conversionCorresponding UCL enhancement rates (&amp;Delta;R) at 545 nmLogic gate operation&amp;nbsp;(Fig. 6):Truth tables for &amp;quot;AND&amp;quot; gate (electrical/optical inputs vs. normalized UCL output)Time-synchronized dynamic response curves</dc:description>
  <dc:subject>Crystal structure; XRD; EDS; SEM; PFM</dc:subject>
  <dc:creator>Jianhai Fu</dc:creator>
  <dc:rights>PUBLIC</dc:rights>
  <dc:rights>https://opendatacommons.org/licenses/by/1-0/</dc:rights>
  <dc:type>dataset</dc:type>
  <dc:relation>http://www.doi.org/10.1016/j.ceramint.2025.10.131</dc:relation>
  <dc:publisher>Science Data Bank</dc:publisher>
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