2026-10-10T12:18:49Z https://www.scidb.cn/oai

10.57760/sciencedb.27086 2025-06-26T10:16:32Z

2025-06-26 Remote Calibration Data for High-Speed Detectors from the Institute of Microelectronics, Chinese Academy of Sciences (IMECAS) doi:10.57760/sciencedb.27086 en At three testing temperature points of -20 ℃, -80 ℃, and -150 ℃, the pulse laser testing method was used to test the time resolution of the silicon drift detector. At each temperature point, no less than 1000 sets of trigger signals t0 and detector response signals t were measured for the time difference (△ t=t-t0). The Gaussian distribution FWHM formed by fitting △ t is the time resolution of the detector.  Time Resolution Measurement of Detectors; Translation: Silicon Drift Detector (SDD); Photodetector Lv Liang RESTRICTED dataset Science Data Bank