2026-10-14T12:04:59Z https://www.scidb.cn/oai

10.57760/sciencedb.37820 2026-05-22T16:27:39Z

2026-05-22 A Dataset of Single Event Effect and On-Orbit Reliability Evaluation of Multi-Core Processor SoC doi:10.57760/sciencedb.37820 en This dataset presents a collection of ground-based heavy ion irradiation test records and on-orbit reliability evaluations for an advanced aerospace-grade multi-core processor System-on-Chip (SoC). Constructed strictly in accordance with the national military standard QJ 10005A-2018 ("Test method for heavy ion irradiation single event effect on semiconductor devices"), the dataset systematically captures the radiation-induced single event sensitivities under varying Linear Energy Transfer (LET) levels. The irradiation experiments were performed at state-of-the-art facilities, including the HI-13 Tandem Accelerator at the China Institute of Atomic Energy and the SESRI Cyclotron at the Harbin Institute of Technology. Multi-core processor; System-on-Chip (SoC); Single event effect (SEE); Heavy ion irradiation testing; Data structure; On-orbit reliability evaluation Qin Fengdi Zhang Fuqiang Chen Qiming Guo Gang PUBLIC https://creativecommons.org/licenses/by-nd/4.0 dataset http://www.doi.org/10.3724/j.0253-3219.2026.hjs.49.260143 Science Data Bank