2026-10-14T14:48:24Z https://www.scidb.cn/oai

10.57760/sciencedb.41881 2026-07-03T15:36:17Z

2026-07-03 Dataset for Raster–Screening–Confirmation Laser-Induced Damage Threshold Evaluation of 532 nm Thin-Film Polarizers doi:10.57760/sciencedb.41881 en This dataset supports the study “Measurement Routine of Laser-Induced Damage Threshold Evaluation for High-Reliability Optical Components”. It contains experimental data used to evaluate the Raster–Screening–Confirmation (RSC) routine for 532 nm thin-film polarizers, including conventional ISO-standard LIDT comparison results, Raster Scan Ramp (RSR) damage-count data, Multi-round Screening (MRS) records, Multi-shot Confirmation (MSC) fatigue data, beam-parameter information, uncertainty-related data, and representative damage morphology images. These data provide the basis for determining the conservative RSC-qualified fluence and for comparing the RSC routine with conventional 1-on-1, S-on-1, and raster-scan LIDT testing methods. laser-induced damage threshold; thin-film polarizer; high-reliability optics Sun Jiaxing PUBLIC https://creativecommons.org/licenses/by-nc/4.0/ dataset Science Data Bank