2026-10-14T15:05:56Z https://www.scidb.cn/oai

10.57760/sciencedb.41917 2026-07-03T14:11:48Z

2026-07-03 PCM Conductance Test Data doi:10.57760/sciencedb.41917 en This dataset is the measured data of a 40 nm process 4 Mb indium doped In GST phase change memory (PCM) chip, collected to address the challenge of PCM conductivity drift in Bayesian neural network (BNN) hardware implementation. Using Teradyne Magnum II automatic testing system, device control is achieved through SET/RESET step pulse programming verification scheme, and raw experimental data such as conductivity and random noise are collected at multiple time scales. Based on this data, a drift compensation algorithm is proposed to achieve 98.08% handwriting recognition accuracy and 33.3 TOPS/W hardware energy efficiency. The dataset can support replication and expansion research in areas such as phase-change memory internal computation, neural network hardware, and multi-level storage device stability.  Phase Change Memory; Conductance Drift; Bayesian Neural Network; In-Memory Computing Xin-Yu Yang Yu Lei Jin-Zhe Tan Li Xie Qian Wang Yong-Hui Zheng Hou-Peng Chen Zhuo-Jun Chen Zhi-Tang Song RESTRICTED dataset http://www.doi.org/10.1002/admt.202501278 Science Data Bank