2026-10-12T00:31:55Z https://www.scidb.cn/oai

10.57760/sciencedb.44591 2026-08-03T17:31:25Z

2026-08-03 Effect of Capping Layer Periodicity on ContaminationInduced Degradation of Broadband High-Reflective Films doi:10.57760/sciencedb.44591 en This dataset focuses on SiO₂/Ta₂O₅ broadband high-reflective films for high-power laser systems, and compiles simulation results and experimental measurement data of films with capping layers of different periodicities before and after contamination. It includes film stack design files for three capping layer periodicities (2λ/4, 3λ/4, and 5λ/4), as well as standing-wave electric field distributions and theoretical reflectance spectra simulated via Essential Macleod software. Meanwhile, the dataset covers complete measurement data before and after rare-earth metal contamination tests, including 400–800 nm reflectance spectra collected by a spectrophotometer, three-dimensional surface topography parameters measured with a laser interferometer, and photothermal temperature rise results obtained by the laser irradiation-infrared thermal imaging method, together with supporting materials such as experimental setup schematics and statistical summary charts for multiple sample groups. Covering the full process from film stack design to performance characterization, this dataset provides reliable fundamental data support for the structural optimization of contamination-resistant optical films for high-power lasers and research on contaminant adsorption mechanisms. capping layer; contamination; broadband high-reflective films; optical performance degradation Yulin RESTRICTED dataset Science Data Bank