2026-10-12T21:29:13Z https://www.scidb.cn/oai

10.57760/sciencedb.hjs.00116 2024-09-25T12:38:44Z

2024-09-25 Development of SiPM batch aging and performance measurement system doi:10.57760/sciencedb.hjs.00116 en [Background]As a new type of optoelectronic detector developed in recent years, SiPM (Silicon Photomultiplier) has the advantages of low cost, miniaturization and low working voltage. It has been widely used in particle detection, medical imaging, high-energy physics and other fields, especially in the field of large-area particle imaging. But large-area imaging requires a large number of SiPMs, so it is very important to achieve a large number of SiPMs batch screening, aging and performance measurements. [Purpose] This study aims to design a batch performance measurement system for SiPMs that enables the simultaneous aging and performance assessment of 512 SiPMs (the number can be further expanded). [Methods] An online control program was developed in Python to measure the aging performance of 512 SiPMs under conditions of 30 °C, 40% relative humidity and an operating voltage of 29V. Subsequently, using the relative derivative method, the variation in the breakdown voltage of the SiPMs was studied under different temperatures (25 °C, 27 °C, 29 °C, and 30 °C) at voltages ranging from 22 V to 29 V and a constant relative humidity of 40%. [Results]The results show that the dark current of SiPM decreases significantly after aging, indicating that the aging process is beneficial for rapidly stabilizing the performance of a large number of SiPMs. After aging, the average breakdown voltage of SiPM is 24.88 V (@25 ℃), which is in good agreement with the manufacturer's data of 25 V (@25 ℃), and the breakdown voltage increased with increasing temperature, and a linear fit yielded a temperature coefficient of 35.3 mV/°C, with a correlation coefficient (R2) of 0.996. [Conclusions]The results demonstrate that the developed system for batch aging and performance measurement of SiPM can simultaneously age a large number of SiPMs, rapidly stabilizing their performance. The system can quickly obtain performance parameters for a large quantity of SiPMs, including I-V characteristics, breakdown voltage, temperature coefficients and so on. This provides significant reference value for the batch screening and performance testing of SiPM. SiPM; Batch measurement; System design; Aging performance measurement; Breakdown voltage Yi Chuqi Han Jifeng Chen Yangmei Hu Peng He Junhan Long Yiyang Liu Xingquan Lin Weiping Qu Guofeng Qian Sen Ren Peipei Ren Jing Song Ruiqiang Wang Penghui Wang Ke Wang Na Wang Zhigang Wang Ci Wang Jiao Yin Shenghua Zhao Chaoyang PUBLIC https://creativecommons.org/licenses/by/4.0/ dataset Science Data Bank