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    <identifier>10.57760/sciencedb.j00145.00050</identifier>
    <datestamp>2026-06-05T09:23:29Z</datestamp>
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  <dc:date>2026-06-05</dc:date>
  <dc:title>Dataset Of Quality-Guided Defect Feature Extraction in Shearography</dc:title>
  <dc:identifier>doi:10.57760/sciencedb.j00145.00050</dc:identifier>
  <dc:language>en</dc:language>
  <dc:description>The dataset contains phase map sequences acquired from defect detection on three specimens using shearography, mask images obtained via instance segmentation with the YOLOv8-seg model, and clear defect feature results of optimal quality extracted from a single image based on a quality-guided defect feature extraction method.</dc:description>
  <dc:subject>Shearography; Instance Segmentation; Defect Feature Extraction; Phase Shifting</dc:subject>
  <dc:creator>Dongsheng Zhang</dc:creator>
  <dc:creator>Xuliang Liu</dc:creator>
  <dc:rights>PUBLIC</dc:rights>
  <dc:rights>https://opendatacommons.org/licenses/pddl/1-0/</dc:rights>
  <dc:type>dataset</dc:type>
  <dc:publisher>Science Data Bank</dc:publisher>
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