2026-10-14T04:37:42Z https://www.scidb.cn/oai

10.57760/sciencedb.j00177.0001l 2026-09-15T08:18:12Z

2026-09-15 Dataset for conclusions on the influence of Si/SiO₂ interface traps in transistors on single‑event upset effect doi:10.57760/sciencedb.j00177.0001l en There are four. txt files in the data source folder of Figure 12-16 in this dataset, which are the source data of Figure 12-16 in the paper. The figures 12-16 in the paper can be drawn using the fit_deu-d ouble.cython and fit_deu_third.python programs in the drawing program folder of Figure 12-18; The bar chart in the drawing program folder of Figure 12-18. The Python program contains the source data for Figure 17 and Figure 18 of the paper. Running this program can draw Figures 17 and 18.  Interface traps; Single event upset; SRAM gao xu Ma Chunwang Luo Xuan Wang Peng Song Mao Li Gang EMBARGO https://creativecommons.org/licenses/by/4.0/ dataset Science Data Bank