2026-10-14T14:12:14Z https://www.scidb.cn/oai

10.57760/sciencedb.j00186.000yk 2026-08-19T14:02:38Z

2026-08-19 Supporting Data for Multi-Mode Single-Event Evaluation of a Sub-20-nm FinFET Radiation-Tolerant Fractional-N PLL doi:10.57760/sciencedb.j00186.000yk en This dataset provides supporting data for the article “Multi-Mode Single-Event Evaluation of a Sub-20-nm FinFET Radiation-Tolerant Fractional-N PLL.” It contains heavy-ion irradiation and two-photon-absorption pulsed-laser single-event-effect measurement data for a radiation-tolerant fractional-N phase-locked loop fabricated in a sub-20-nm FinFET technology. The dataset includes LET-dependent single-event cross sections measured in integer mode, a controlled comparison between integer and fractional modes at an LET of 86 MeV·cm²/mg, and pulsed-laser triggering thresholds of major functional modules in integer, fractional, and spread-spectrum clocking (SSC) modes. Key experimental conditions and event-detection criteria required to interpret the measurements are also provided. The dataset supports verification and analysis of the operating-mode-dependent single-event characteristics and radiation tolerance reported in the associated article. Fractional-N PLL; Single-Event Effects; Heavy-Ion Irradiation; Pulsed Laser; FinFET Zhang Zhenhua Sun Hanhan Yang Jianqun Liang Bin Cui Xiuhai Li Xingji PUBLIC https://creativecommons.org/licenses/by/4.0/ dataset Science Data Bank