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    <datestamp>2026-08-26T13:44:44Z</datestamp>
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  <dc:date>2026-08-26</dc:date>
  <dc:title>Associated Data of the Article《Microwave Absorption Performance and Thermal Stability of V-Doped Ti3AlC2》</dc:title>
  <dc:identifier>doi:10.57760/sciencedb.jim.0002w</dc:identifier>
  <dc:language>en</dc:language>
  <dc:description>1. Original Plotting Data (&amp;ldquo;Origin Raw Data&amp;rdquo; folder):Contains all the basic data used to generate the figures (Figure 1&amp;ndash;8) in the manuscript. The data include X-ray diffraction (XRD) data, X-ray photoelectron spectroscopy (XPS) data, thermogravimetric (TG) analysis data, scanning electron microscopy (SEM) and elemental mapping data, electrical conductivity data, electromagnetic parameter data, reflection loss (RL) calculation data, attenuation constant (&amp;alpha;) data, and impedance matching (|Zin/Z0|) data. These data can be processed using Origin or other data analysis software for figure reproduction and further data analysis.2. Image Files (.tif format):Contains all high-resolution figure files used in the manuscript, including the formatted images corresponding to Figure 1&amp;ndash;8. The contents cover phase structure characterization, elemental valence analysis, thermal stability analysis, microstructural characterization, electromagnetic parameter variation, microwave absorption performance analysis, radar cross-section (RCS) simulation results, and schematic illustration of the microwave absorption mechanism of Ti₃AlC₂ and V-doped samples. These files support the presentation and discussion of the experimental results in the manuscript.3. Layout Source Files (.pptx format):Contains the PowerPoint source files used for figure preparation, including image processing, combination, annotation, and layout procedures for Figure 1&amp;ndash;8, facilitating future reference and figure reproduction.4. Original SEM/TEM/EDS Images:Contains the original image files used for characterizing the microstructure and elemental distribution of the materials, including scanning electron microscopy (SEM) images, transmission electron microscopy (TEM) images, and energy-dispersive spectroscopy (EDS) elemental mapping data. These unprocessed and unformatted original images can be used for further analysis of the material morphology, crystal structure, and elemental distribution characteristics.</dc:description>
  <dc:subject>MAX phase; V doping; Microwave absorption; Thermal stability</dc:subject>
  <dc:creator>Chang Yukai</dc:creator>
  <dc:creator>Chai Pengbo</dc:creator>
  <dc:creator>Zhou Aiguo</dc:creator>
  <dc:rights>PUBLIC</dc:rights>
  <dc:rights>https://creativecommons.org/licenses/by/4.0/</dc:rights>
  <dc:type>dataset</dc:type>
  <dc:publisher>Science Data Bank</dc:publisher>
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