2026-10-14T18:09:02Z https://www.scidb.cn/oai

10.57760/sciencedb.jim.00061 2026-05-22T16:22:31Z

2026-05-22 The data of the article "Preparation of Wrinkled Hexagonal Boron Nitride Films by Bubbling Chemical Vapor Deposition" doi:10.57760/sciencedb.jim.00061 en The micromorphology and structure of h-BN synthesized via the B-CVD method were observed using scanning electron microscopy (SEM, JEOL JSM 7800F) and transmission electron microscopy (TEM, JEOL JEM-2100). Raman spectroscopy (Raman, Renishaw inVia) was employed to measure the characteristic peak of the E2g vibration mode of h-BN. The raw data were processed using the Lorentzian fitting method to analyze the peak shift and full width at half maximum (FWHM), thereby evaluating the thickness and crystalline quality of the product. An X-ray diffractometer (XRD, Shimadzu XRD-6100) was used to characterize the crystal structure of the h-BN powder. A Fourier transform infrared spectrometer (FTIR, Thermo Scientific Nicolet iS50) was utilized to characterize the typical characteristic absorption peaks of h-BN and detect surface-adsorbed functional groups. The ultraviolet-visible absorption spectrum of h-BN was characterized using an ultraviolet-visible absorption spectrometer (UV-Vis, HORIBA NanoLog) to determine its optical bandgap. Hexagonal boron nitride; Bubbling chemical vapor deposition; Morphological characterization; Structural characterization Dai Zongrun Shi Zhiyuan Zhu Yulin He Peng Yu Qingkai EMBARGO https://creativecommons.org/licenses/by-nc-nd/4.0/ dataset http://www.doi.org/10.15541/jim20260206 Science Data Bank