2026-10-12T17:02:30Z https://www.scidb.cn/oai

10.57760/sciencedb.space.00588 2023-04-06T09:18:23Z

2023-04-06 Integrated circuit static defect detection system for MRAM test experimental data doi:10.57760/sciencedb.space.00588 en The dataset contains data on electrical parameter changes during laser scanning using an IC static defect scanning localization system of our own design for detecting static defects in MRAM devices. By analyzing the data from abnormal chips compared to normal chips, we identify the areas where abnormal damage may occur. static defect; system; MRAM wu wen jian PUBLIC https://creativecommons.org/publicdomain/zero/1.0/ dataset http://www.doi.org/10.3390/photonics10050540 Science Data Bank