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    <identifier>10.57760/sciencedb.space.01488</identifier>
    <datestamp>2024-09-09T11:25:09Z</datestamp>
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  <dc:date>2024-09-09</dc:date>
  <dc:title>The effect of proton irradiation on GaN HEMT</dc:title>
  <dc:identifier>doi:10.57760/sciencedb.space.01488</dc:identifier>
  <dc:language>en</dc:language>
  <dc:description>Proton irradiation can cause degradation of the electrical characteristics of GaN HEMT devices. Proton irradiation experiments were conducted to obtain the influence of different energies and doses of protons on the electrical characteristics of GaN HEMT devices</dc:description>
  <dc:subject>GaN;  PROTON;  Characteristics</dc:subject>
  <dc:creator>Liang Yanan</dc:creator>
  <dc:rights>RESTRICTED</dc:rights>
  <dc:type>dataset</dc:type>
  <dc:publisher>Science Data Bank</dc:publisher>
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