2026-10-14T15:12:50Z https://www.scidb.cn/oai

10.57760/sciencedb.space.03303 2025-11-17T11:12:54Z

2025-11-17 Research on Laser-Induced SEU Phenomenon in Xilinx 7 Series FPGAs doi:10.57760/sciencedb.space.03303 en This dataset records the details of the SEU experiment conducted on a 28nm SRAM-based FPGA using a pulsed laser, and provides accurate laser energy-response cross-section curves. The discussion covers how to determine the optimal focal depth and minimum step size, analyzes the impact of different scanning areas on the number of SEUs, and examines the influence of the number of SEUs on the reaction cross-section. Pulsed laser; 28 nm SRAM FPGA; Equivalent LET; SEU wu hao Zhu Xiang RESTRICTED dataset Science Data Bank