2026-10-12T16:48:52Z https://www.scidb.cn/oai

10.57760/sciencedb.space.03546 2026-04-23T09:19:17Z

2026-04-23 Error rate of different page types across P/E cycles doi:10.57760/sciencedb.space.03546 en This dataset corresponds to 3D TLC NAND flash memory chips subjected to 4,000 program/erase (P/E) cycles and 3D QLC NAND flash memory chips subjected to 3,000 P/E cycles, respectively. Using the test logic integrated within the SOPC system, erase operations were first performed on the test blocks, followed by writing random data. The data was then read back, and the raw bit error rate was statistically analyzed according to different page types. Finally, the error rate variation curve was plotted as shown in the figure. error rate; page types; P/E cycles 严强 EMBARGO https://creativecommons.org/licenses/by-nc-nd/4.0/ dataset http://www.doi.org/10.1109/les.2026.3676415 Science Data Bank